{"created":"2023-05-15T12:31:10.343642+00:00","id":738,"links":{},"metadata":{"_buckets":{"deposit":"13ad4d24-7fe2-4f90-904b-d45ad3c02d06"},"_deposit":{"created_by":6,"id":"738","owners":[6],"pid":{"revision_id":0,"type":"depid","value":"738"},"status":"published"},"_oai":{"id":"oai:fit.repo.nii.ac.jp:00000738","sets":["256:305:382"]},"author_link":["3402","3403","3407","3408","3405","3404","3401","3406","3409"],"item_3_alternative_title_23":{"attribute_name":"タイトル（ヨミ）","attribute_value_mlt":[{"subitem_alternative_title":"インピーダンス ブンコウ ニヨル デンキ ニジュウソウ キャパシタ ノ レッカ ジョウタイ ノ ハアク ト オンライン シンダン ギジュツ カイハツ ノ タメ ノ キソ ケンキュウ"}]},"item_3_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2021-10-31","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"13","bibliographicPageStart":"7","bibliographicVolumeNumber":"4","bibliographic_titles":[{"bibliographic_title":"福岡工業大学総合研究機構研究所報"}]}]},"item_3_description_17":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_3_description_47":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"論文(Article)","subitem_description_type":"Other"}]},"item_3_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"In this study, we grasped the deterioration state of water-based EDLC using impedance spectroscopy and performed basic analysis for the development of online diagnostic technology, and clarified the voltage dependence and temperature dependence of impedance with respect to changes in measurement frequency. In addition, reversible and irreversible deterioration diagnosis was performed in a high temperature and overvoltage environment, and the deterioration state of the activated carbon electrode surface could be grasped.","subitem_description_type":"Other"}]},"item_3_full_name_2":{"attribute_name":"著者(ヨミ)","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"3404","nameIdentifierScheme":"WEKO"}],"names":[{"name":"オオモリ, トモキ"}]},{"nameIdentifiers":[{"nameIdentifier":"3405","nameIdentifierScheme":"WEKO"}],"names":[{"name":"ナカニシ, マサヒロ"}]},{"nameIdentifiers":[{"nameIdentifier":"3406","nameIdentifierScheme":"WEKO"}],"names":[{"name":"タシマ, ダイスケ"}]}]},"item_3_full_name_3":{"attribute_name":"別言語の著者","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"3407","nameIdentifierScheme":"WEKO"}],"names":[{"name":"OMORI, Tomoki"}]},{"nameIdentifiers":[{"nameIdentifier":"3408","nameIdentifierScheme":"WEKO"}],"names":[{"name":"NAKANISHI, Masahiro"}]},{"nameIdentifiers":[{"nameIdentifier":"3409","nameIdentifierScheme":"WEKO"}],"names":[{"name":"TASHIMA, Daisuke"}]}]},"item_3_publisher_37":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"福岡工業大学総合研究機構"}]},"item_3_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"24345725","subitem_source_identifier_type":"ISSN"}]},"item_3_text_38":{"attribute_name":"出版者（ヨミ）","attribute_value_mlt":[{"subitem_text_value":"フクオカ コウギョウ ダイガク ソウゴウ ケンキュウ キコウ"}]},"item_3_text_48":{"attribute_name":"資源タイプ・ローカル","attribute_value_mlt":[{"subitem_text_value":"紀要論文"}]},"item_3_text_49":{"attribute_name":"資源タイプ・NII","attribute_value_mlt":[{"subitem_text_value":"Departmental Bulletin Paper"}]},"item_3_text_50":{"attribute_name":"資源タイプ・DCMI","attribute_value_mlt":[{"subitem_text_value":"text"}]},"item_3_text_51":{"attribute_name":"資源タイプ・ローカル表示コード","attribute_value_mlt":[{"subitem_text_value":"02"}]},"item_3_text_79":{"attribute_name":"コメント","attribute_value_mlt":[{"subitem_text_value":"エレクトロニクス研究所"}]},"item_3_version_type_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"大森, 朋希"}],"nameIdentifiers":[{"nameIdentifier":"3401","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"中西, 真大"}],"nameIdentifiers":[{"nameIdentifier":"3402","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"田島, 大輔"}],"nameIdentifiers":[{"nameIdentifier":"3403","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","displaytype":"detail","filename":"福工大-総合研究機構-所報4-2.pdf","filesize":[{"value":"1.7 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"url":"https://fit.repo.nii.ac.jp/record/738/files/福工大-総合研究機構-所報4-2.pdf"},"version_id":"85905dea-d5bc-4508-b0ab-a97b92617c08"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Electrical double layer capacitor","subitem_subject_scheme":"Other"},{"subitem_subject":"Impedance spectroscopy","subitem_subject_scheme":"Other"},{"subitem_subject":"Online diagnostic technology","subitem_subject_scheme":"Other"},{"subitem_subject":"Electrical double layer capacitor","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Impedance spectroscopy","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Online diagnostic technology","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"インピーダンス分光による電気二重層キャパシタの劣化状態の把握とオンライン診断技術開発のための基礎研究","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"インピーダンス分光による電気二重層キャパシタの劣化状態の把握とオンライン診断技術開発のための基礎研究"},{"subitem_title":"Basic research for grasping the deterioration state of electric double layer capacitors by impedance spectroscopy and developing online diagnostic technology","subitem_title_language":"en"}]},"item_type_id":"3","owner":"6","path":["382"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-12-10"},"publish_date":"2021-12-10","publish_status":"0","recid":"738","relation_version_is_last":true,"title":["インピーダンス分光による電気二重層キャパシタの劣化状態の把握とオンライン診断技術開発のための基礎研究"],"weko_creator_id":"6","weko_shared_id":-1},"updated":"2023-05-15T13:54:02.314813+00:00"}