{"created":"2023-05-15T12:31:08.661197+00:00","id":704,"links":{},"metadata":{"_buckets":{"deposit":"b06870b7-cba4-4760-af02-405016440866"},"_deposit":{"created_by":6,"id":"704","owners":[6],"pid":{"revision_id":0,"type":"depid","value":"704"},"status":"published"},"_oai":{"id":"oai:fit.repo.nii.ac.jp:00000704","sets":["256:257:371"]},"author_link":["3298","3280","3297","3281","3283","3282"],"item_3_alternative_title_23":{"attribute_name":"タイトル（ヨミ）","attribute_value_mlt":[{"subitem_alternative_title":"pn セツゴウ ダイオード ノ シサク ト ソノ デンキテキ トクセイ"}]},"item_3_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1996-10-30","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"188","bibliographicPageStart":"183","bibliographicVolumeNumber":"29","bibliographic_titles":[{"bibliographic_title":"福岡工業大学研究論集"},{"bibliographic_title":"RESEARCH BULLETIN OF FUKUOKA INSTITUTE OF TECHNOLOGY","bibliographic_titleLang":"en"}]}]},"item_3_description_17":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_3_description_47":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"論文(Article)","subitem_description_type":"Other"}]},"item_3_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"We diffuse impurities to silicon single crystallization and in the semiconductor de vice production laboratory (clean room) on the campus of Fukuoka Institute of Technology, produced pn junction diode experimentally. We measure an electric characteristics of this diode, and consider the voltage-current in low electric current domain. ","subitem_description_type":"Other"}]},"item_3_full_name_2":{"attribute_name":"著者(ヨミ)","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"3282","nameIdentifierScheme":"WEKO"}],"names":[{"name":"ハットリ, タケノリ"}]},{"nameIdentifiers":[{"nameIdentifier":"3283","nameIdentifierScheme":"WEKO"}],"names":[{"name":"シノダ, カナエ"}]}]},"item_3_full_name_3":{"attribute_name":"別言語の著者","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"3297","nameIdentifierScheme":"WEKO"}],"names":[{"name":"HATTORI, Takenor "}]},{"nameIdentifiers":[{"nameIdentifier":"3298","nameIdentifierScheme":"WEKO"}],"names":[{"name":"SHINODA, Kanae"}]}]},"item_3_publisher_37":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"福岡工業大学"}]},"item_3_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"02876620","subitem_source_identifier_type":"ISSN"}]},"item_3_text_38":{"attribute_name":"出版者（ヨミ）","attribute_value_mlt":[{"subitem_text_value":"フクオカ コウギョウ ダイガク"}]},"item_3_text_39":{"attribute_name":"別言語の出版者","attribute_value_mlt":[{"subitem_text_value":"Fukuoka Institute of Technology"}]},"item_3_text_48":{"attribute_name":"資源タイプ・ローカル","attribute_value_mlt":[{"subitem_text_value":"紀要論文"}]},"item_3_text_49":{"attribute_name":"資源タイプ・NII","attribute_value_mlt":[{"subitem_text_value":"Departmental Bulletin Paper"}]},"item_3_text_50":{"attribute_name":"資源タイプ・DCMI","attribute_value_mlt":[{"subitem_text_value":"text"}]},"item_3_text_51":{"attribute_name":"資源タイプ・ローカル表示コード","attribute_value_mlt":[{"subitem_text_value":"02"}]},"item_3_version_type_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"服部, 毅範"}],"nameIdentifiers":[{"nameIdentifier":"3280","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"篠田, 鼎"}],"nameIdentifiers":[{"nameIdentifier":"3281","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","displaytype":"detail","filename":"29(1)-183.pdf","filesize":[{"value":"519.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"url":"https://fit.repo.nii.ac.jp/record/704/files/29(1)-183.pdf"},"version_id":"b82176b4-6b99-4f29-ad89-5e22289dc5ec"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"pn junction","subitem_subject_scheme":"Other"},{"subitem_subject":"Saturation current","subitem_subject_scheme":"Other"},{"subitem_subject":"Dynamic resistance","subitem_subject_scheme":"Other"},{"subitem_subject":"Ideality factor","subitem_subject_scheme":"Other"},{"subitem_subject":"Forward voltage","subitem_subject_scheme":"Other"},{"subitem_subject":"pn junction","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Saturation current","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Dynamic resistance","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Ideality factor","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Forward voltage","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"pn接合ダイオードの試作とその電気的特性","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"pn接合ダイオードの試作とその電気的特性"},{"subitem_title":"The Measurement of Trial Manufacture of pn Junction Diode  and the Electric Characteristics.","subitem_title_language":"en"}]},"item_type_id":"3","owner":"6","path":["371"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-02-26"},"publish_date":"2021-02-26","publish_status":"0","recid":"704","relation_version_is_last":true,"title":["pn接合ダイオードの試作とその電気的特性"],"weko_creator_id":"6","weko_shared_id":-1},"updated":"2023-05-15T14:01:05.013181+00:00"}