{"created":"2023-05-15T12:30:54.425655+00:00","id":480,"links":{},"metadata":{"_buckets":{"deposit":"b28b3972-d705-4573-861f-06d49ff018bb"},"_deposit":{"created_by":2,"id":"480","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"480"},"status":"published"},"_oai":{"id":"oai:fit.repo.nii.ac.jp:00000480","sets":["256:305:306"]},"author_link":["2300","2298","2299"],"item_3_alternative_title_23":{"attribute_name":"タイトル（ヨミ）","attribute_value_mlt":[{"subitem_alternative_title":"エイキュウ ジシャク オ モチイタ ハンドウタイ ２ジゲン デンシケイ ノ ホール ソクテイ"}]},"item_3_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-12","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"22","bibliographicPageStart":"19","bibliographicVolumeNumber":"1","bibliographic_titles":[{"bibliographic_title":"福岡工業大学総合研究機構研究所所報"}]}]},"item_3_description_17":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_3_description_47":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"論文(Article)","subitem_description_type":"Other"}]},"item_3_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Hall measurement is useful to investigate basic electronic properties of semiconductor wafers. Since the invention of the strong permanent magnets, Hall measurement systems using permanent magnets have been commercially available. However, these systems include too many functions and therefore are too expensive for single laboratory use. We propose here a very simple Hall measurement system with a neodymium permanent magnet at low cost. Using this system, electron density and mobility in a Si-doped AlGaAs/GaAs single heterostructure were measured. Obtained results are comparable to those found by using the commercially available system.","subitem_description_type":"Other"}]},"item_3_description_78":{"attribute_name":"URL","attribute_value_mlt":[{"subitem_description":"24345725","subitem_description_type":"Other"}]},"item_3_full_name_2":{"attribute_name":"著者(ヨミ)","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"2299","nameIdentifierScheme":"WEKO"}],"names":[{"name":"スズキ, キョウイチ"}]}]},"item_3_full_name_3":{"attribute_name":"別言語の著者","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"2300","nameIdentifierScheme":"WEKO"}],"names":[{"name":"SUZUKI, Kyoichi"}]}]},"item_3_publisher_37":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"福岡工業大学総合研究機構"}]},"item_3_text_18":{"attribute_name":"形態","attribute_value_mlt":[{"subitem_text_value":"1181560 bytes"}]},"item_3_text_38":{"attribute_name":"出版者（ヨミ）","attribute_value_mlt":[{"subitem_text_value":"フクオカ コウギョウ ダイガク ソウゴウ ケンキュウ キコウ"}]},"item_3_text_48":{"attribute_name":"資源タイプ・ローカル","attribute_value_mlt":[{"subitem_text_value":"紀要論文"}]},"item_3_text_49":{"attribute_name":"資源タイプ・NII","attribute_value_mlt":[{"subitem_text_value":"Departmental Bulletin Paper"}]},"item_3_text_50":{"attribute_name":"資源タイプ・DCMI","attribute_value_mlt":[{"subitem_text_value":"text"}]},"item_3_text_51":{"attribute_name":"資源タイプ・ローカル表示コード","attribute_value_mlt":[{"subitem_text_value":"01"}]},"item_3_text_79":{"attribute_name":"コメント","attribute_value_mlt":[{"subitem_text_value":"エレクトロニクス研究所(Electronics Research Laboratory)"}]},"item_3_version_type_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"鈴木, 恭一"}],"nameIdentifiers":[{"nameIdentifier":"2298","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-09-14"}],"displaytype":"detail","filename":"永久磁石を用いた半導体2次元電子系のホール測定.pdf","filesize":[{"value":"1.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"永久磁石を用いた半導体2次元電子系のホール測定.pdf","url":"https://fit.repo.nii.ac.jp/record/480/files/永久磁石を用いた半導体2次元電子系のホール測定.pdf"},"version_id":"1cf25902-2c7f-429b-b6bc-72d6b0e93a4c"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Hall Measurement","subitem_subject_scheme":"Other"},{"subitem_subject":"Semiconductor Heterostructure","subitem_subject_scheme":"Other"},{"subitem_subject":"Two-Dimensional Electron System","subitem_subject_scheme":"Other"},{"subitem_subject":"Neodymium","subitem_subject_scheme":"Other"},{"subitem_subject":"Hall Measurement","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Semiconductor Heterostructure","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Two-Dimensional Electron System","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Neodymium","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"永久磁石を用いた半導体２次元電子系のホール測定","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"永久磁石を用いた半導体２次元電子系のホール測定"},{"subitem_title":"Hall Measurements with a Permanent Magnet for Semiconductor Two-Dimensional Electron Systems","subitem_title_language":"en"}]},"item_type_id":"3","owner":"2","path":["306"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-05-08"},"publish_date":"2019-05-08","publish_status":"0","recid":"480","relation_version_is_last":true,"title":["永久磁石を用いた半導体２次元電子系のホール測定"],"weko_creator_id":"2","weko_shared_id":2},"updated":"2023-05-15T12:48:49.316872+00:00"}